The many different sample types for which XRD can be used to study, make the right choice of the measurement configuration challenging. Depending on the sample size, X-ray transparency, chemical composition, and many other sample properties, different X-ray sources, measurement geometries and slit sizes may be suited best. One thing, however, that can lead to clear improvements in almost all regards concerning XRD, is the use of a primary multilayer monochromator.
In this report, a detailed look at the properties and capabilities of this optical configuration is presented.
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