Surface roughness is one of the most important quality parameters for wafer materials in industry and science. Atomic force microscopy is a perfect method to evaluate surface roughness with high precision.
An optimized measurement workflow for wafer handling, batch measurement and data evaluation enables analysis on nano-scale with high efficiency.
Download this report to read more.
Anton Paar Ltd
Tel: +44(0)1992514730
Click here and register to access technical articles and white papers from this company
Promoted content: Does social media work for engineers – and how can you make it work for you?
So in addition to doing their own job, engineers are expected to do the marketing department´s work for them as well? Sorry, wait a minute, I know the...