Surface roughness is one of the most important quality parameters for wafer materials in industry and science. Atomic force microscopy is a perfect method to evaluate surface roughness with high precision.
An optimized measurement workflow for wafer handling, batch measurement and data evaluation enables analysis on nano-scale with high efficiency.
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Five ways to prepare for your first day
If I may add my own personal Tip No. 6 it goes something like this: From time to time a more senior member of staff will start explaining something...