Surface roughness is one of the most important quality parameters for wafer materials in industry and science. Atomic force microscopy is a perfect method to evaluate surface roughness with high precision.
An optimized measurement workflow for wafer handling, batch measurement and data evaluation enables analysis on nano-scale with high efficiency.
Download this report to read more.
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UK homes more suitable for heat pumps than expected
Hello Gordoun, you can use a simple empirical formula to estimate COP (my own analysis, unpublished, based on the Building Research Establishment...