Tosca 400, the first Atomic Force Microscope specifically designed for industrial users, has been applied to characterize pit arrays on soft PDMS membranes. The distribution and 3D geometry of the pits are precisely measured from high-resolution AFM topography images.
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Small-scale domestic solar could cause power failures
I do hope that AI will not mean we loose the experienced staff. AI is pattern matching, what happens if an unprecedented event happens? We will need...