Tosca 400, the first Atomic Force Microscope specifically designed for industrial users, has been applied to characterize pit arrays on soft PDMS membranes. The distribution and 3D geometry of the pits are precisely measured from high-resolution AFM topography images.
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UK productivity hindered by digital skills deficit – report
This is a bit of a nebulous subject. There are several sub-disciplines of 'digital skills' which all need different approaches. ...