Tosca 400, the first Atomic Force Microscope specifically designed for industrial users, has been applied to characterize pit arrays on soft PDMS membranes. The distribution and 3D geometry of the pits are precisely measured from high-resolution AFM topography images.
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Comment: Industry must prioritise environmentally responsible adoption of Gen AI
Industry needs to develop the application of AI by all legal and economic means possible. Big-Brother needs to be kept out or we will have a...