INSTRON’S MICROIMPACT TESTING SYSTEM IS A UNIQUE SOLUTION FOR THE ELECTRONICS INDUSTRY
Instron, a leading provider of testing equipment designed to evaluate mechanical properties of materials and components, introduces its MicroImpact Testing System, which precisely strikes a solder ball at a high rate of speed while simultaneously measuring force and displacement.
The MicroImpact tester is designed for R&D or process quality control of microelectronic devices. It has the ability to achieve shear speed from .2 m/s to 1 m/s using a patented low-inertia load transducer. The use of an LVDT is incorporated with the striker to collect the force and displacement data. This direct attachment of the load cell to the striker minimizes noise from the machine response.
Impulse™ software is part of a complete instrumentation package for impact data acquisition and analysis. It incorporates several new customer-requested features and enhancements, which improve and simplify test setup, data analysis and reporting of results. Key features include a versatile new Report Editor for developing custom test report templates, more flexibility for Data Explorer, and improved display of graphs and results tables. Impulse software also includes new diagnostics for debugging test setups and enables users to integrate deflection measurement data directly with Impulse test results and analysis.
Additional features of the MicroImpact system include accurate energy consumption; comprehensive calculation capability with versatile Report Editor Wizard for developing reports; six digital filter functions with user settable cutoff frequencies and filter order functions; and two high-magnifications for precise setup and failure inspection.
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